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New observations on the electrical properties and instabilities of pure and metal doped SiO2 films

✍ Scribed by K.V. Krishna; J.J. Delima; F.C. Eze; A.E. Owen

Publisher: Elsevier Science
Year: 1985
Weight: 199 KB
Volume: 129
Category: Article
ISSN: 0378-4363
DOI: 10.1016/0378-4363(85)90578-9

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