๐”– Scriptorium
โœฆ   LIBER   โœฆ

๐Ÿ“

New Methods of Concurrent Checking (Frontiers in Electronic Testing)

โœ Scribed by Michael Goessel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld


Publisher
Springer
Year
2008
Tongue
English
Leaves
186
Edition
1
Category
Library

โฌ‡  Acquire This Volume

No coin nor oath required. For personal study only.

โœฆ Synopsis


Written by a team of two leading experts and two very successful young former PhD students, New Methods of Concurrent Checking describes new methods of concurrent checking, such as partial duplication, use of output dependencies, complementary circuits, self-dual parity, self-dual duplication and others.ย A special chapter demonstrates how the new general methods of concurrent checking can be more specifically applied to regular structures to obtain optimum results. This is exemplified for all types of adders up to 64 bits with a level of detail never before presented in the literature. The clearly written text is illustrated by about 100 figures. New Methods of Concurrent Checking is approved in many university courses for graduate and undergraduate students, and it is of interest to students and teachers in electrical engineering and computer science, researchers and designers and all readers who are interested in the design and the understanding of reliable circuits and computers.

โœฆ Subjects


ะะฒั‚ะพะผะฐั‚ะธะทะฐั†ะธั;ะะฐะดะตะถะฝะพัั‚ัŒ, ัั€ะณะพะฝะพะผะธะบะฐ ะธ ะบะฐั‡ะตัั‚ะฒะพ ะะกะžะ˜ะฃ;


๐Ÿ“œ SIMILAR VOLUMES


New Methods of Concurrent Checking
โœ Michael Gรถessel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld (auth.) ๐Ÿ“‚ Library ๐Ÿ“… 2008 ๐Ÿ› Springer ๐ŸŒ English

<p><P><EM>New Methods of Concurrent Checking</EM> is the ultimate reference to answer the question as to how the best possible state-of-the-art error detection circuits can be designed. The most effective methods of concurrent checking for digital circuits are comprehensively described which were de

Emerging Nanotechnologies: Test, Defect
โœ Mohammad Tehranipoor ๐Ÿ“‚ Library ๐Ÿ“… 2007 ๐ŸŒ English

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies of

Power-Constrained Testing of VLSI Circui
โœ Nicola Nicolici, Bashir M. Al-Hashimi ๐Ÿ“‚ Library ๐Ÿ“… 2000 ๐ŸŒ English

Initial Public Offerings (IPOs) are hot with today's aggressive, experienced investors--but telling the winners from the losers can be difficult. Inside IPOs explains the ins and outs of this potentially lucrative market, including which industries investors should target or avoid, when to buy or se

Oscillation-Based Test in Mixed-Signal C
โœ Gloria Huertas Sanchez, Diego Vazquez Garcia de la Vega, Adoracion Rueda Rueda, ๐Ÿ“‚ Library ๐Ÿ“… 2006 ๐ŸŒ English

This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test โ€“ OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-or

Fault Diagnosis of Analog Integrated Cir
โœ Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha ๐Ÿ“‚ Library ๐Ÿ“… 2005 ๐ŸŒ English

Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examinesย the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits an