✦ LIBER ✦

New Method of Double-Crystal X-Ray Diffractrometric Determination of the Strained State in Surface-Layer Structures

✍ Scribed by Fedorov, V. A. ;Ganshin, V. A. ;Korkishko, Yu. N.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Estimation of the strain state of GexSi1

✍ X.F. Duan; K.K. Fung; Y.M. Chu 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 479 KB

The X-ray method for the determination o

✍ Prof. Dr. J. Auleytner; J. Bak; Z. Furmanik; M. Maciaszek; A. Saulewicz 📂 Article 📅 1980 🏛 John Wiley and Sons 🌐 English ⚖ 242 KB 👁 2 views

Effect of diffuse scattering in the stra

✍ Cembali, F. ;Servidori, M. ;Gabilli, E. ;Lotti, R. 📂 Article 📅 1985 🏛 John Wiley and Sons 🌐 English ⚖ 569 KB

Ambiguity in the Strain Profile Determin

✍ Cembali, F. ;Gabilli, E. ;Lotti, R. ;Servtdori, M. ;Zani, A. 📂 Article 📅 1986 🏛 John Wiley and Sons 🌐 English ⚖ 156 KB

The method of integral characteristics i

✍ Kohn, V. G. ;Kovalchuk, M. V. ;Imamov, R. M. ;Lobanovich, E. F. 📂 Article 📅 1981 🏛 John Wiley and Sons 🌐 English ⚖ 518 KB

On the Possibility of Layer-by-Layer Ana

✍ Kohn, V. G. ;Samoilova, L. V. 📂 Article 📅 1992 🏛 John Wiley and Sons 🌐 English ⚖ 414 KB