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New insights in the relation between electron trap generation and the statistical properties of oxide breakdown

✍ Scribed by Degraeve, R.; Groeseneken, G.; Bellens, R.; Ogier, J.L.; Depas, M.; Roussel, P.J.; Maes, H.E.

Book ID: 114537241
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 184 KB
Volume: 45
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.662800

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