New experimental findings for single-event gate rupture in MOS capacitors and linear devices

✍ Scribed by Lum, G.K.; Boruta, N.; Baker, J.M.; Robinette, L.; Shaneyfelt, M.R.; Schwank, J.R.; Dodd, P.E.; Felix, J.A.

• Book ID: 119994764
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 658 KB
• Volume: 51
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2004.840262