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Linear energy transfer dependence of single event gate rupture in SiC MOS capacitors

โœ Scribed by Deki, Manato; Makino, Takahiro; Iwamoto, Naoya; Onoda, Shinobu; Kojima, Kazutoshi; Tomita, Takuro; Ohshima, Takeshi

Book ID
121770015
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
690 KB
Volume
319
Category
Article
ISSN
0168-583X

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