A new physics-based model for understanding single-event gate rupture in linear devices

✍ Scribed by Boruta, N.; Lum, G.K.; O'Donnell, H.; Robinette, L.; Shaneyfelt, M.R.; Schwank, J.R.

• Book ID: 118252479
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 170 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.983151