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Device-Physics-Based Analytical Model for Single-Event Transients in SOI CMOS Logic

✍ Scribed by Kobayashi, Daisuke; Hirose, Kazuyuki; Ferlet-Cavrois, VÉronique; McMorrow, Dale; Makino, Takahiro; Ikeda, Hirokazu; Arai, Yasuo; Ohno, Morifumi

Book ID: 111863183
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 264 KB
Volume: 56
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.2009.2034004

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