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New electron microscopy for composition analysis of GaAs/AlxGa1−xAs heterointerfaces

✍ Scribed by H. Kakibayashi; F. Nagata

Publisher: Elsevier Science
Year: 1986
Weight: 47 KB
Volume: 174
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(86)90017-4

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