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New BIST Schemes for Structural Testing of Pipelined Analog to Digital Converters

✍ Scribed by Eduardo J. Peralías; Adoración Rueda; José L. Huertas


Book ID
110316227
Publisher
Springer US
Year
2001
Tongue
English
Weight
687 KB
Volume
17
Category
Article
ISSN
0923-8174

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