✦ LIBER ✦

New Criterion for Testing Analog-to-Digital Converters for Statistical Evaluation

✍ Scribed by Koller, Hans U.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Testing methodologies for analog-to-digi

✍ Brandolini, A.; Gandelli, A. 📂 Article 📅 1992 🏛 IEEE 🌐 English ⚖ 834 KB

New BIST Schemes for Structural Testing

✍ Eduardo J. Peralías; Adoración Rueda; José L. Huertas 📂 Article 📅 2001 🏛 Springer US 🌐 English ⚖ 687 KB

Analog-to-digital converter testing—new

✍ A. Cruz Serra; F. Alegria; R. Martins; M. Fonseca da Silva 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 532 KB

A new on-chip digital BIST for analog-to

✍ Mehdi Ehsanian; Bozena Kaminska; Karim Arabi 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 970 KB

Improved compensation for analog-to-digi

✍ Irons, F.H.; Hummels, D.M.; Kennedy, S.P. 📂 Article 📅 1991 🏛 IEEE ⚖ 412 KB

An Automated Test Set for High Resolutio

✍ Souders, T. Michael; Flach, Donald R. 📂 Article 📅 1979 🏛 IEEE 🌐 English ⚖ 1016 KB