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New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions

✍ Scribed by A.S. Gudovskikh; J.P. Kleider; R. Stangl

Book ID: 116669044
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 217 KB
Volume: 352
Category: Article
ISSN: 0022-3093
DOI: 10.1016/j.jnoncrysol.2005.11.100

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