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Negative permittivity of ZnO thin films prepared from aluminum and gallium doped ceramics via pulsed-laser deposition

✍ Scribed by Bodea, M. A.; Sbarcea, G.; Naik, G. V.; Boltasseva, A.; Klar, T. A.; Pedarnig, J. D.


Book ID
120085613
Publisher
Springer
Year
2012
Tongue
English
Weight
622 KB
Volume
110
Category
Article
ISSN
1432-0630

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## Abstract InAs co‐doped ZnO films were grown on sapphire substrates by pulsed laser deposition. The grown films have been characterized using X‐ray diffraction (XRD), Hall effect measurements, Atomic force microscope (AFM) and Field emission scanning electron microscope (FESEM) in order to invest