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Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs

✍ Scribed by D. Danković; I. Manić; V. Davidović; S. Djorić-Veljković; S. Golubović; N. Stojadinović

Book ID
108210727
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
378 KB
Volume
47
Category
Article
ISSN
0026-2714

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