Negative-bias-temperature-instability and hot carrier effects in nanowire junctionless p-channel multigate transistors

✍ Scribed by Tae Park, Jong; Young Kim, Jin; Pierre Colinge, Jean

• Book ID: 120396662
• Publisher: American Institute of Physics
• Year: 2012
• Tongue: English
• Weight: 908 KB
• Volume: 100
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3688245