Actions of negative bias temperature instability (NBTI) and hot carriers in ultra-deep submicron p-channel metal–oxide–semiconductor field-effect transistors (PMOSFETs)

✍ Scribed by Hong-Xia, Liu; Yue, Hao

• Book ID: 121418871
• Publisher: Institute of Physics
• Year: 2007
• Tongue: English
• Weight: 539 KB
• Volume: 16
• Category: Article
• ISSN: 1009-1963
• DOI: 10.1088/1009-1963/16/7/052