Probing photonic and optoelectronic stru
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Renaud Bachelot; Gilles Lerondel; Sylvain Blaize; Sebastien Aubert; Aurelien Bru
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Article
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2004
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John Wiley and Sons
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English
β 546 KB
## Abstract This report presents the Apertureless Scanning Optical NearβField Microscope as a powerful tool for the characterization of modern optoelectronic and photonic components with subβwavelength resolution. We present an overview of the results we obtained in our laboratory over the past few