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Near-edge X-ray absorption fine-structure studies of GaN under low-energy nitrogen ion bombardment

✍ Scribed by V.A. Coleman; M. Petravić; K.-J. Kim; B. Kim; G. Li

Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
202 KB
Volume
252
Category
Article
ISSN
0169-4332

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