A high-resolution electron microscopy st
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Shiro Takeno; Shin-ich Nakamura; Yoshiaki Terashima; Tadao Miura
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Article
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1993
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Elsevier Science
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English
β 521 KB
The authors investigated defect structures introduced into so-called infinite-layer SrCuO 2 thin films sputtered on a SrTiO3 (100) snbstrate. By means of both cross-sectional and plan-view high-resolution electron microscopy (HREM), it has been revealed that the films were epitaxially grown with the