A high-resolution electron microscopy study on epitaxial infinite- layer SrCuO2 thin films grown on a SrTiO3 (100) substrate

✍ Scribed by Shiro Takeno; Shin-ich Nakamura; Yoshiaki Terashima; Tadao Miura

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 521 KB
• Volume: 206
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/0921-4534(93)90703-s

✦ Synopsis

The authors investigated defect structures introduced into so-called infinite-layer SrCuO 2 thin films sputtered on a SrTiO3 (100) snbstrate. By means of both cross-sectional and plan-view high-resolution electron microscopy (HREM), it has been revealed that the films were epitaxially grown with their c-axis normal to the substrate surface, and several types of defect structures have been estimated. They were essentially composed of double Sr-O planes that make { 100} atomic walls. It is remarkable that such wails tended to arrange as loop-like configurations, and also could produce a different ordered structure, i.e., a Sr2CuO3-1ike structure in local regions. The authors propose defect structural models in the epitaxial infinite-layer SrCuO2 thin films in detail.