𝔖 Bobbio Scriptorium
✦   LIBER   ✦

A high-resolution electron microscopy study of vanadium deposited on the basal plane of sapphire

✍ Scribed by Y. Ikuhara; P. Pirouz


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
913 KB
Volume
52
Category
Article
ISSN
0304-3991

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Study of the stacking faults in a-plane
✍ H. Fang; L.W. Sang; W.X. Zhu; H. Long; T.J. Yu; Z.J. Yang; G.Y. Zhang πŸ“‚ Article πŸ“… 2011 πŸ› Elsevier Science 🌐 English βš– 596 KB

Optically specular a-plane GaN was grown on r-sapphire substrate by metal-organic chemical vapor deposition (MOCVD). Surface morphology and crystal structure anisotropic behavior related to defects with a specific distribution were characterized by X-ray diffraction (XRD) and atomic force microscopy