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Narrow-width effects of shallow trench-isolated CMOS with n+ -polysilicon gate

โœ Scribed by Ohe, K.; Odanaka, S.; Moriyama, K.; Hori, T.; Fuse, G.


Book ID
114535378
Publisher
IEEE
Year
1989
Tongue
English
Weight
632 KB
Volume
36
Category
Article
ISSN
0018-9383

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