✦ LIBER ✦
A closed-form back-gate-bias related inverse narrow-channel effect model for deep-submicron VLSI CMOS devices using shallow trench isolation
✍ Scribed by Shih-Chia Lin; Kuo, J.B.; Kuo-Tai Huang; Shih-Wei Sun
- Book ID
- 118690037
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 344 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
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