Nanoscale experimental study of a micro-crack in silicon
โ Scribed by C.W. Zhao; Y.M. Xing
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 571 KB
- Volume
- 403
- Category
- Article
- ISSN
- 0921-4526
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โฆ Synopsis
A micro-crack in silicon was experimentally investigated using high-resolution transmission electron microscopy (HRTEM). The crystal lattice structure of a micro-crack was carefully observed at a HRTEM image scale of approximately 18 nm. The crystal lattice structure of the crack tip region was observed to be regular with good periodicity. The HRTEM images of the micro-crack demonstrate that the microcrack cleavage expands along two crystal planes, where the principal cleavage plane is the (111) crystal plane.
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