Nanoscale deformation analysis of a crack-tip in silicon by geometric phase analysis and numerical moiré method

✍ Scribed by C.W. Zhao; Y.M. Xing

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 910 KB
• Volume: 48
• Category: Article
• ISSN: 0143-8166
• DOI: 10.1016/j.optlaseng.2009.12.010