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Experimental procedure in HREM studies of polysilicon-silicon interfaces

โœ Scribed by A. Albu-Yaron; J.C. Barry; C.R. Booker


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
103 KB
Volume
14
Category
Article
ISSN
0304-3991

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A micro-crack in silicon was experimentally investigated using high-resolution transmission electron microscopy (HRTEM). The crystal lattice structure of a micro-crack was carefully observed at a HRTEM image scale of approximately 18 nm. The crystal lattice structure of the crack tip region was obse