✦ LIBER ✦

Nanometer technology effects on fault models for IC testing

✍ Scribed by Aitken, R.C.

Book ID: 114545965
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 441 KB
Volume: 32
Category: Article
ISSN: 0018-9162
DOI: 10.1109/2.803640

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