Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies

✍ Scribed by Zhangcai Huang; Kurokawa, A.; Hashimoto, M.; Sato, T.; Minglu Jiang; Inoue, Y.

• Book ID: 117908350
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 947 KB
• Volume: 29
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2009.2035539