Nanomechanical characterizations of metals and thin films
✍ Scribed by M. Göken; M. Kempf; M. Bordenet; H. Vehoff
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 347 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0142-2421
No coin nor oath required. For personal study only.
✦ Synopsis
The local mechanical properties of di †erent phases and grains in structural metallic alloys, composites and thin Ðlms determine their bulk properties and deformation behaviour. A nanoindenting atomic force microscope allows quantitative measurements of the local modulus of elasticity and the nanohardness with lateral resolutions of nearly 50 nm. Investigations on di †erent nickel-base superalloys (Waspaloy, CMSX-6), NiAl, c-TiAl and steels were performed, where their local mechanical properties could be determined separately on phases with lateral sizes down to 50 nm. With this measurement, the hardness of small cº-precipitates and of the matrix in the superalloys was determined. Other examples are given, where the local mechanical properties around a crack tip and across a grain boundary were determined. The load-displacement curves obtained for these specimens often show pop-ins similar to yield point phenomena. The estimated maximum shear stress under the indenter at this load level is comparable to the theoretical shear strength of the materials. The investigations show that the appearance of pop-ins depends strongly on the surface preparation conditions and the existence of oxide layers.
Investigations of thin gold Ðlms on glassy substrates of thickness 20-400 nm show an increasing hardness at lower indentation depths and higher hardness values of the thin Ðlms in comparison to bulk specimens.
📜 SIMILAR VOLUMES
Optical methods are used to determine the thickness of thin metal films, with emphasis on spectroscopic ellipsometry and transmission. We discuss the conditions where this is possible and how to determine the optical constants for the material. The determination of the thickness of each of two metal
Results concerning the operation of a new ultrahigh vacuum (UHV) ion-beam assisted deposition system for in situ investigation of ultrahard thin films are reported. A molecular beam epitaxy (MBE) chamber attached to a surface science system (SPEAR) has been redesigned for deposition of cubic-boron n