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Atomic Layer Growth and Characterization of ZnO Thin Films

✍ Scribed by K. Saito; Y. Yamamoto; A. Matsuda; S. Izumi; T. Uchino; K. Ishida; K. Takahashi

Publisher: John Wiley and Sons
Year: 2002
Tongue: English
Weight: 116 KB
Volume: 229
Category: Article
ISSN: 0370-1972
DOI: 10.1002/1521-3951(200201)229:2<925::aid-pssb925>3.0.co;2-7

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