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Nanocrystallites in luminescent porous silicon characterized by Raman scattering

✍ Scribed by I. Gregora; B. Champagnon; A. Halimaoui

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
351 KB
Volume
57
Category
Article
ISSN
0022-2313

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## Abstract In this paper, porous silicon (PS) layers of different porosity and thickness have been investigated by Raman spectroscopy. The estimation of built‐in strain in PS is reported. Moreover, wetting phenomena in PS layers have been also investigated. The results prove a reversible blue shif