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Multilayer optical elements for generation and analysis of circularly polarized X-rays

✍ Scribed by J.B. Kortright; J.H. Underwood

Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
442 KB
Volume
291
Category
Article
ISSN
0168-9002

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A new X-ray microprobe system for trace heavy element analysis using ultraprecise X-ray mirror optics of 300 mm long working distance has been developed at beamline 37XU of SPring-8. A focusing test has been performed in the X-ray energy range 20-37.7 keV. A focused beam size of 1.3 mm (V) Γ‚ 1.5 mm