Proton-induced X-ray cross sections for selected elements Fe to As and applications of X-ray analysis to semiconductor systems

✍ Scribed by Tom J. Gray; R. Lear; R.J. Dexter; F.N. Schwettmann; K.C. Weimer

• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 673 KB
• Volume: 19
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(73)90028-x