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Interface analysis of sputtered W-C, Rh-C and Ni-C multilayers for soft X-ray applications

✍ Scribed by Pierre Boher; Philippe Houdy; Claude Schiller

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 572 KB
Volume: 175
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(89)90823-7

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