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Multi-ring structures for contact resistance measurements on metal-thin-layer semiconductors

✍ Scribed by Zhu De Guang

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 225 KB
Volume: 34
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(91)90114-e

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