Resistivity measurement of thin doped semiconductor layers by means of four point-contacts arbitrarily spaced on a circumference of arbitrary radius

✍ Scribed by Egbert Hesse

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 338 KB
• Volume: 21
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(78)90330-1