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Monte Carlo simulation studies of sidewall roughening during reactive ion etching

✍ Scribed by S.K. Pani; F. Tjiptoharsono; C.C. Wong; C.S. Premachandran; P.V. Ramama; M.K. Iyer


Book ID
106020551
Publisher
Springer
Year
2007
Tongue
English
Weight
720 KB
Volume
88
Category
Article
ISSN
1432-0630

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