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Monte Carlo simulation of temperature dependence of X-ray diffraction intensity of Ge(0 0 1) surface with defects

✍ Scribed by Yoshimichi Nakamura; Hiroshi Kawai; Yoshihide Yoshimoto; Masaru Tsukada

No coin nor oath required. For personal study only.

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Monte Carlo simulation of temperature dependence of X-ray diffraction intensity of Ge(0&#xa0;0&#xa0;1) surface with defects