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Monte Carlo simulation of microwave noise temperature in cooled GaAs and InP

✍ Scribed by Pantoja, J.M.M.; Chih-I Lin, ; Shaalan, M.; Sebastian, J.L.; Hartnagel, H.L.


Book ID
118015936
Publisher
IEEE
Year
2000
Tongue
English
Weight
74 KB
Volume
48
Category
Article
ISSN
0018-9480

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Uncertainty analysis of a commercial mic
✍ Mark H. Weatherspoon; R. Joe Smith πŸ“‚ Article πŸ“… 2010 πŸ› John Wiley and Sons 🌐 English βš– 263 KB

## Abstract A Monte Carlo simulation, a non‐linear fitting routine, and an uncertainty extraction routine are used to analyze the uncertainty of a commercial microwave noise temperature measurement system. Measured data for an __S__/__C__ band synthetic FET‐based cold load, two microwave solid‐stat