Uncertainty analysis of a commercial microwave noise temperature measurement system using Monte Carlo simulations
✍ Scribed by Mark H. Weatherspoon; R. Joe Smith
- Publisher
- John Wiley and Sons
- Year
- 2010
- Tongue
- English
- Weight
- 263 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0894-3370
- DOI
- 10.1002/jnm.757
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✦ Synopsis
Abstract
A Monte Carlo simulation, a non‐linear fitting routine, and an uncertainty extraction routine are used to analyze the uncertainty of a commercial microwave noise temperature measurement system. Measured data for an S/C band synthetic FET‐based cold load, two microwave solid‐state noise diode hot loads, and an ambient load is obtained, and the measurement system uncertainties are subsequently assessed using different DUTs. An estimation of the measurement system uncertainties is determined for a range of DUT temperatures, and the results are consistent with the noise temperature uncertainties calculated from the measured data at the same frequency. Copyright © 2010 John Wiley & Sons, Ltd.