Using a model for the electric Ðeld built up in insulating materials irradiated by electrons, a Monte Carlo simulation method has been applied to the binary oxides MgO, and The results show the Al . alteration of the shape of the depth distribution of characteristic x-ray production, the U(qz) fun
Monte Carlo Simulation in Electron Probe Microanalysis. Comparison of Different Simulation Algorithms
✍ Scribed by Salvat, Francesc ;Llovet, Xavier ;Fernández-Varea, José M. ;Sempau, Josep
- Publisher
- Springer-Verlag
- Year
- 2006
- Weight
- 312 KB
- Volume
- 155
- Category
- Article
- ISSN
- 0344-838X
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