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Monitoring the composition of the Cd1 −zZnzTe heteroepitaxial layers by spectroscopic ellipsometry

✍ Scribed by M. V. Yakushev; V. A. Shvets; I. A. Azarov; S. V. Rykhlytski; Yu. G. Sidorov; E. V. Spesivtsev; T. S. Shamirzaev

No coin nor oath required. For personal study only.

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