โ Scribed by S.M. Alexander; T.B. Gor
No coin nor oath required. For personal study only.
We present a framework for monitoring, diagnosis, and control of industrial processes. This framework utilizes the multiresolution analysis capability of wavelet theory. Wavelet coefficient patterns at different scales, under a variety of process conditions, are noted to form process f'mgerprints, these fingerprints yield process fault diagnosis. This knowledge facilitates efficient control.
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