We present a framework for monitoring, diagnosis, and control of industrial processes. This framework utilizes the multiresolution analysis capability of wavelet theory. Wavelet coefficient patterns at different scales, under a variety of process conditions, are noted to form process f'mgerprints, t
✦ LIBER ✦
Integrated control and diagnosis of sequential processes
✍ Scribed by K.-E. Åezén
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 910 KB
- Volume
- 4
- Category
- Article
- ISSN
- 0967-0661
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✦ Synopsis
It is shown how DMP, a model-based on-line diagnosis can be combined with Grafcet. This gives a convenient way of structuring on-line diagnosis of mode-changing processes where the process model is different in the different operating modes. It is also an example of how diagnosis can be integrated with sequence control logic. The approach is exemplified on a realtime simulation model of an ultra-high-temperature sterilization process. The paper also shows how Grafcet can be used for the implementation of alarm filters for event-based diagnosis.
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