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Moments analysis of X-ray reflection profiles

✍ Scribed by F. Rieutord; A. Braslau; R. Simon; H.J. Lauter; V. Pasyuk

Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
243 KB
Volume
221
Category
Article
ISSN
0921-4526

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✦ Synopsis

We discuss an approach towards understanding the limitations of X-ray or neutron reflectivity methods for the determination of an interfacial density profile. A novel analysis is presented based on an expansion of the reflectivity function in terms of moments of the density profile.

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Ah&act--This work shows the feasibility of surface analysis though the detection of characteristic fluorescent radiation in the total-reflection regime. A theoretical formalism to correlate surface parameters with X-ray Buorescence intensities from multiple-layer samples was developed. Experimental