๐”– Bobbio Scriptorium
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Interfacial electronic profile from X-ray reflectivity

โœ Scribed by A.A. Kornyshev; K.M. Robinson


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
416 KB
Volume
219
Category
Article
ISSN
0009-2614

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Fourier analysis of X-ray diffraction pr
โœ F.R.L Schoening ๐Ÿ“‚ Article ๐Ÿ“… 1956 ๐Ÿ› Elsevier Science โš– 473 KB

Fourier analysis of the diffraction profiles obtained from spectrographically pure tantalum filings gave the following dimensions for the coherently reflecting domains: 170 A and 100 A for a hydrogen-free sample in the [ 1101 and [IO01 directions respectively, and 160 '4 and 95 .A for a sample conta