Molecular-Beam Epitaxy of GaN: A Phase Diagram
โ Scribed by Adelmann, C. ;Brault, J. ;Martinez-Guerrero, E. ;Mula, G. ;Mariette, H. ;Si Dang, Le ;Daudin, B.
- Publisher
- John Wiley and Sons
- Year
- 2001
- Tongue
- English
- Weight
- 134 KB
- Volume
- 188
- Category
- Article
- ISSN
- 0031-8965
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โฆ Synopsis
We investigate the growth modes for GaN homoepitaxy. Several parameters have been taken into account: the growth rate, the metal/N ratio value and the substrate temperature. The observation of time variation of the RHEED diffraction pattern and the study of thick samples has permitted the determination of a phase diagram of the Ga surface coverage during GaN homoepitaxy as a function of III/V ratio and substrate temperature. Furthermore, we address the different GaN surface morphologies obtained in different regions of the phase diagram.
๐ SIMILAR VOLUMES
GaN films are grown by plasma-assisted molecular beam epitaxy on 6H-SiC(0001) substrates. Suitable substrate preparation and growth conditions are found which greatly improve the structural quality of the films. Threading dislocation densities of about 1 ร 10 9 cm --2 for edge dislocations and 1 ร 1