𝔖 Bobbio Scriptorium

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Moisture induced failure mode in a plastic encapsulated dynamic timing circuit : S. Shabde, J. Edwards and W. Meuli. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 33

Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 121 KB
Volume: 17
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(78)90591-7

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