Hot carrier injection in the dual polysi
✦ LIBER ✦
A reliability failure mode in dynamic MOS circuits—the unopened metal to polysilicon contact window and the floating gate transistor : W. R. Ortner and J. T. Clements. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 16
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 121 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0026-2714
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