✦ LIBER ✦
Hot carrier injection in the dual polysilicon gate structure and its related reliability effects on dynamic RAM refresh time : M. L. Malwah, J. R. Edwards and M. Bandali. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 23
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 121 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.